Presentation Information
[P2-4-17]Development of a Current Overshoot Detection Circuit for Power Semiconductor Switches
Satoshi Sugahara2, *Takashi Toriyabe1, Takato Sugawara1 (1. Fuji Electric Co., Ltd. (Japan), 2. Fukuyama University (Japan))
Keywords:
Current overshoot,EMI,High-speed switching,Overshoot detection,Power semiconductor switch,SiC