Presentation Information

[APP1-13]Strain-stress Coupling Cryogenic Test Platform Based on Digital Image Correlation

*LINjie Zhang1,2, Liancheng Xie1,2, Bixi Li1,2, ZIchun Huang1,2, Fuzhi Shen1, Hengcheng Zhang1, Hao Zhang1 (1. Key Laboratory of Cryogenic Science and Technology, TIPC, CAS (China), 2. University of Chinese Academy of Sciences (China))

Keywords:

DIC,PINN,Cryogenic,Strain-stress

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