[ED6] Novel Devices, Materials and Fabrication

10:45 AM - 11:00 AM JST(1:45 AM - 2:00 AM UTC)

[ED6-03] Temperature and Dose Dependence of Helium Ion Microscopy-Fabricated YBCO Josephson Junctions

*Tetsuro Misawa¹, Shinichi Ogawa¹, Yukinori Morita¹, Shigeyuki Ishida¹, Hiroshi Eisaki¹, Chiharu Urano (1. National Institute of Advanced Industrial Science and Technology (AIST) (Japan))

Keywords:

HTS,Josephson junction,Helium ion microscopy,Critical current,IcRn,Shapiro steps

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