[WB4] Advanced Processing

11:30 AM - 11:45 AM JST(2:30 AM - 2:45 AM UTC)

[WB4-05] Analysis of critical current in network-patterned YBa₂Cu₃O_7-y films using maximum flow problem

*Ryoga Nagae¹, Tomoya Horide¹, Takuya Ohwa², Yutaka Yoshida¹ (1. Nagoya University (Japan), 2. Kyushu Institute of Technology (Japan))

Keywords:

Critical current,Ic Distribution,Inhomogeneity,Mathematical modeling

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