Presentation Information
[WB7-02]Big Data Analysis of XRD/SEM for Enhancing the Critical Current of 2G-HTS Tapes
*Vladimir Vyatkin1, Hoa Dao1, Deniz Sanal1, Konstantin Vereshchagin1, Ivan Veshchunov1, Kamil Etxagibel1, Roman Valikov1, Alexander Borisov1, Marat Gaifullin1, Sergey Samoilenkov1, Valery Petrykin1, Sergey Lee1 (1. Faraday Factory Japan (Japan))
Keywords:
2G-HTS,YBCO,Applied superconductivity,XRD,SEM,Critical current,Data-driven manufacturing
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