Presentation Information
[WBP1-12]Correlation analysis of YBCO film between a-axis oriented grain characteristics based on AFM image analysis and XRD
*Ibuki Kato1, Shin Okumura1, Tomoya Horide1, Yutaka Yoshida1 (1. Nagoya University (Japan))
Keywords:
REBCO,a-axis oriented grain,microstructure,AFM,XRD,image analysis
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