Presentation Information
[WBP1-12]Correlation analysis of YBCO film between a-axis oriented grain characteristics based on AFM image analysis and XRD
*Ibuki Kato1, Shin Okumura1, Tomoya Horide1, Yutaka Yoshida1 (1. Nagoya University (Japan))
Keywords:
REBCO,a-axis oriented grain,microstructure,AFM,XRD,image analysis
Password required to view
Access to the ISS2025 conference program, abstracts, presentation slides, and posters is restricted and requires a password. The password will be provided exclusively to registered participants. We appreciate your understanding and cooperation in maintaining the integrity of the event.