Presentation Information
[PC4-02-INV]Electronic structure of compressively strained bilayer nickelate thin film
*BaiYang Wang1,2, Sebastien N Abadi1,2, Yidi Liu1,2, Yu Zhang3, Yong Zhong1,2, Yijun Yu1,2, Berit H Goodge4, Xiaoliang Zhang3, Yi-Ming Wu1, Ruohan Wang1,2, Jiarui Li1,2, Yaoju Tarn1,2, Eun Kyo Ko1,2, Vivek Thampy2, Chun Lin2, Makoto Hashimoto2, Donghui Lu2, Young S Lee1,2, Thomas P Devereaux1,2, Chunjing Jia3, Harold Y Hwang1,2, Zhi-Xun Shen1,2 (1. Stanford University (USA), 2. SLAC National Laboratory (USA), 3. University of Florida (USA), 4. Max Planck Institute for Chemical Physics of Solids (Germany))
Keywords:
superconductivity,angle resolved photoemission spectroscopy,thin film,nickelate,correlated physics
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