Presentation Information
[WBP2-31]Deep Learning-Based Image Analysis for Microstructural Investigation of REBCO Coated Conductors
*Yuri Hoshino1, Kotomi Ogi1, Daito Fukui1, Fumitake Kametani2, Tetsuhiro Obana3, Takanobu Mato4, So Noguchi4, Akiyasu Yamamoto1 (1. Dept. of Biomedical Systems Eng., Tokyo Univ. of Agricul. and Technol. (Japan), 2. National High Magnetic Field Laboratory, Florida State Univ. (USA), 3. NIFS (Japan), 4. Faculty of information Science and Technology, Hokkaido Univ. (Japan))
Keywords:
REBCO-coated conductors,Deep Learning,Semantic Segmentation,SEM,Defect Detection
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