[WB7] Data-Driven Approaches II

2:15 PM - 2:30 PM JST(5:15 AM - 5:30 AM UTC)

[WB7-03] Automated Analysis and Machine-Learning Prediction of Critical Current Density in YBCO Coated Conductors

*Vladimir Vyatkin¹, Ashat Shaik¹, Naing Yati¹, Hoa Dao¹, Ivan Veshchunov¹, Konstantin Vereshchagin¹, Maki Okube¹, Marat Gaifullin¹, Sergey Samoilenkov¹, Valery Petrykin¹, Sergey Lee¹ (1. Faraday Factory Japan (Japan))

Keywords:

YBCO coated conductors,critical current density,X-ray diffraction,machine learning,quality control