[PCP1] PCP1

[PCP1-05] Optical Contrast Analysis of Single-Crystal Bi2212 and Establishment of a Non-Destructive Thickness Measurement Method

*JIRANTHANIN KASEAN¹, Yoshitaka Nakamura¹, Takaharu Kamada¹ (1. National Institute of Technology(KOSEN), Hachinohe College (Japan))

Keywords:

Bi2212,High-temperature superconductor,Non-destructive optical thickness measurement,Multispectral imaging / Bandpass filters,Fresnel's multilayer reflection model,Mechanical exfoliation