Presentation Information
[WB8-06]Estimation of delamination mechanisms in YBCO coated conductors based on microstructural observation of delaminated surfaces
*Yusuke Kawagishi1, Shintaro Kawashima1, Ryo Teranishi1 (1. Kyushu Univ. (Japan))
Keywords:
coated conductor,thin film,microstructure,delamination,YBCO
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