[WBP2b] WBP2

[WBP2-28] Multimodal analysis of bending-induced critical current degradation region in coated conductor using scanning hall probe microscopy and scanning electron microscopy

*Takeharu KATO¹, Junko Ariga¹, Daisaku Yokoe¹, Yasutoshi Mizuta¹, Zeyu Wu², Takanobu Kiss² (1. Japan Fine Ceramics Center (Japan), 2. Kyushu University (Japan))

Keywords:

critical current degradation,coated conductors,SEM,SHPM,multimodal analysis