Presentation Information

[P14]Observation of stacking disorder in noble gas nanoparticles by single-shot X-ray diffraction

Akinobu Niozu¹, Shohei Asakura¹, Yoshiaki Kumagai², James R Harries³, Tatsuo Gejo⁴, Mana Yagi⁴, Susumu Kuma⁵, Shin-ichi Wada¹, Kakuto Yoshioka¹, Giorgio Rossi⁶, Alice Finardi⁶, Catalin Miron⁷, Shigeki Owada^8,9, Takashi Kameshima^8,9, Yasumasa Joti^8,9, Koji Motomura^8,9, Tadashi Togashi^8,9, Tetsuo Katayama^8,9, Kensuke Tono^8,9, Makina Yabashi^8,9, Christoph Bostedt^10,11, Kazuhiro Matsuda¹², Kiyoshi Ueda¹³, *Kiyonobu Nagaya¹⁴ (1. Hiroshima University (Japan), 2. Nara Women’s University (Japan), 3. QST (Japan), 4. University of Hyogo (Japan), 5. RIKEN (Japan), 6. Università degli Studi di Milano (Italy), 7. Université Paris-Saclay (France), 8. RIKEN SPring-8 Center (Japan), 9. JASRI (Japan), 10. Paul-Scherrer Institute (Switzerland), 11. EPFL (Switzerland), 12. Kumamoto University (Japan), 13. Tohoku University (Japan), 14. Kyoto University (Japan))

Keywords:

XFEL,X-ray diffraction,noble gas nanoparticles,structure

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