Presentation Information
[R3P-01]Measurements of local stress using TEM in-situ observation
*Akira MIYAKE1, Yohei Igami1, Toru Matsumoto1, Satoko Motai3, Ryuichi Nomura2 (1. Kyoto Univ. Sci., 2. Kyoto Univ., 3. Yamagata Univ.)
Keywords:
electron microscope,in-situ experiment,nano-deformation
<div class="is-print-hide" style="height:0; overflow:hidden; max-width:100%; padding-bottom:84%; position:relative;"><iframe allow="fullscreen" allowfullscreen="true" frameborder="0" src="https://confit2.atlas.jp/articles/event/jams2021/slide/R3P-01", style="height:100%; left:0; position:absolute; top:0; width:100%;"></iframe></div>
Extensive in-situ loading/ indentation experiments have been conducted inside a transmission electron microscope (TEM) to understand the nanomechanical properties of materials (e.g., Wang et al., 2015). In these studies, the stress on the sample were estimated just by dividing the applied load by the area loaded on and/or analyzed by the finite element method. In this study, we succeeded in measuring the stress state within a sample directly from the electron diffraction patterns of a deformed sample.
Extensive in-situ loading/ indentation experiments have been conducted inside a transmission electron microscope (TEM) to understand the nanomechanical properties of materials (e.g., Wang et al., 2015). In these studies, the stress on the sample were estimated just by dividing the applied load by the area loaded on and/or analyzed by the finite element method. In this study, we succeeded in measuring the stress state within a sample directly from the electron diffraction patterns of a deformed sample.
