Presentation Information
[R1P-01]Verification of the Effect of Plasma Etching for Rock Thin Sections[Presentation award entry]
*Momoka Yamakawa1, Yui Kouketsu1, Katsuyoshi Michibayashi1 (1. Nagoya Univ. Env.)
Keywords:
Plasma etching,SEM-EBSD,Olivine
In SEM-EBSD analysis, removal of the damaged layer by polishing during thin section preparation is important to obtain accurate crystallographic information of minerals. In this study, we examined the effect of plasma etching, which is seldom used in Earth science field. We measured the steps of olivine etched by atmospheric plasma, measured the transmittance of Os coatings etched by atmospheric and Ar plasma, and verified EBSD data of the peridotite thin sections etched by atmospheric plasma.
<div class="is-print-hide" style="height:0; overflow:hidden; max-width:100%; padding-bottom:84%; position:relative;"><iframe allow="fullscreen" allowfullscreen="true" frameborder="0" src="https://confit2.atlas.jp/articles/event/jams2022/slide/R1P-01", style="height:100%; left:0; position:absolute; top:0; width:100%;"></iframe></div>
<div class="is-print-hide" style="height:0; overflow:hidden; max-width:100%; padding-bottom:84%; position:relative;"><iframe allow="fullscreen" allowfullscreen="true" frameborder="0" src="https://confit2.atlas.jp/articles/event/jams2022/slide/R1P-01", style="height:100%; left:0; position:absolute; top:0; width:100%;"></iframe></div>