Presentation Information
[318]Crack initiation behavior in Fatigue Crack Networks Formation of Die Attach Joint
*Yoshiki Abe1, Yoshiharu Kariya2, Hiroshige Sugimoto1, Yoshinori Yokoyama3, Ryuichiro Hanada3, Shinnosuke Soda3 (1. Graduate School of Shibaura Institute of Technology, 2. Department of Materials Science and Engineering, Shibaura Institute of Technology, 3. Advanced Technology R&D Center, Mitsubishi Electric Corporation)
Keywords:
Fatigue crack network,Die attach,Lead-free solder,Power module
パワーモジュールダイアタッチの疲労き裂ネットワークの寿命予測方法を検討するため,接合体試験片を用いて温度サイクル試験を行い,疲労き裂ネットワークのき裂個数とサイクル数の関係を精査し,定式化を行った.
