[S4] S4.New Materials Science on Nanoscale Structures and Functions at Crystal Interface(1)

1:40 PM - 1:55 PM JST(4:40 AM - 4:55 AM UTC)

[S4.2] Investigation of high-voltage degradation mechanism of sulfide based all-solid-state batteries using Synchrotron X-ray Diffraction

*Li Yanzhao¹, Yamanaka Kazuki¹, Watanabe Kenta¹, Shimizu Keisuke², Tamura Kazuhisa³, Suzuki Kota², Kanno Ryoji², Hirayama Masaaki^1,2 (1. Dept. Chemical Science and Engineering, Inst. Science Tokyo, 2. Research Center for All-Solid-State Battery, Inst. Science Tokyo, 3. Materials Sciences Research Center, JAEA)

Keywords:

全固体電池,硫化物電解質,エピタキシャル薄膜,放射光X線回折,固体/固体界面

放射光Ｘ線回折により、硫化物系全固体電池の正極界面における正極の表面部分は4.6Vまで充電しても構造が安定な一方、正極バルクは正極表面と異なる劣化挙動を示すことを明らかにした。