[S1] S1 New Materials Science on Nanoscale Structures and Functions at Crystal Interface II

1:00 PM - 1:40 PM JST(4:00 AM - 4:40 AM UTC)

[S1.5] [Keynote Lecture] Advanced STEM Imaging for Atomic-Scale Structural Analysis and Electromagnetic-Field Mapping at Materials Interfaces

○Takehito Seki¹, Naoya Shibata^1,2 (1. UTokyo, 2. JFCC)

Keywords:

STEM

Recent detector advances have expanded the information available from STEM. Magnetic-field-free electron microscopy has enabled magnetic materials to be observed with reduced field perturbation. This presentation reviews recent STEM imaging methods and their applications to materials research.