[19p-A601-1~9] 7.1 X-ray technologies

1:30 PM - 1:45 PM JST(4:30 AM - 4:45 AM UTC)

[19p-A601-3] Scanning X-ray Fluorescence Microscopy using white SR

〇Akio Yoneyama¹, Masahide Kawamoto¹, Satoshi Takeya², Midori Yasuda³ (1.SAGA LS, 2.AIST, 3.Nishikyushu Univ.)

Keywords:

scanning X-ray fluorescence microscope,fluorescence map

A novel scanning X-ray fluorescence microscopy using white synchrotron radiation has been constructed at SAGA Light Source. By introducing a new total-reflection mirror with a KB configuration of a designed incidence angle of 5 mrad, the central energy has been increased from 6 to 10 keV, and the sensitivity to heavy elements has been greatly improved. In the demonstration measurement, a focused beam of 1.3 microns was formed, and various fluorescence maps of plants were obtained successfully.