[21a-P04-1~11] 6.5 Surface Physics, Vacuum

[21a-P04-1] Development of a method for extracting local features of scanning probe microscope images

Sota Tsubokura¹, Shoya Kawano², Hirohisa Hioki³, Haruo Noma¹, 〇Taketoshi Minato⁴ (1.College of Information Science and Engineering, Ritsumeikan Univ., 2.Kyushu Inst. Tech., 3.Graduate School of Human and Environmental Studies, Kyoto Univ., 4.Institute for Molecular Science)

Keywords:

image processing,local features,scanning probe microscopy

Scanning probe microscopy has been widely used as a method to analyze physical properties at the nano-level. The images obtained contain local features, which cannot be understood simply by looking at the obtained data as is. In this study, we introduce a new method to analyze local features obtained by scanning probe microscopy through image analysis.