Presentation Information
[22a-P02-10]Visualization of Nano-Deformation Behavior and Nano-Conductivity of Stretchable Conductor Polymer Composites Using Atomic Force Microscopy
〇Xiaobin Liang1, Ken Nakajima1 (1.Tokyo Tech.)
Keywords:
atomic force microscope,elastic conductor,visualization
New stretchable conductive materials utilizing conductive nanofillers and organic conductors are being developed. However, the nanomechanisms of conductivity and mechanical properties of materials during deformation remain unclear, and there is a need for techniques to directly measure deformation behavior and conductivity at the nanoscale. In this presentation, we aim to develop an innovative method to directly visualize nano deformation and nano conductivity during deformation by combining nano stress distribution atomic force microscopy (AFM) and conductive atomic force microscopy (C-AFM).