[23p-A305-1~13] 13.8 Optical properties and light-emitting devices

3:30 PM - 3:45 PM JST(6:30 AM - 6:45 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[23p-A305-8] Analysis of trap levels using thermoluminescence measurements with electron beam excitation

〇Yosuke Tsuji¹, Ryota Minamino¹, Shuto Sugito¹, Jofu Furusawa¹, Haruki Fukada¹, Yamaguchi Atsushi¹ (1.Kanazawa Institute of Technology)

Keywords:

phosphors,Semiconductor Materials