[16a-C43-1~11] 7.1 X-ray technologies

11:45 AM - 12:00 PM JST(2:45 AM - 3:00 AM UTC)

[16a-C43-11] Single digit spatial resolution achieved by localization precision analysis on three-dimensional data of X-ray lightsheet microscope

〇yoshiki kohmura¹, Sierra Dean¹, Hidekazu Takano¹, Tetsuya Ishikawa¹ (1.RIKEN)

Keywords:

three-dimensional high resolution imaging,X-ray lightsheet microscopy,three-dimensional localization precision analysis

We developed the 3D localization precision analysis to realize the 3D super resolution imaging of scintillation event observed by X-ray lightsheet microscope. It uses the localization precision analysis in the in-plane image and the model fitting on the in-depth intensity profile assuming a Gaussian function. We applied this analysis on the X-ray lightsheet microscopy image data taken from the distributed scintillator nanoparticles affixed on a spherical surface of a glass microsphere. The position uncertainty of 2 nm (in-depth) and 7 nm (in-plane) in standard deviation were obtained using the analysis. The shape of the glass microsphere was also determined to have the radius of 5845 nm and the surface roughness of better than 90 nm. This method will be useful for the surface measurement of micron-scale objects.