[16p-A36-1~8] Advanced Technology on the Cyber-Physical System for the Society 5.0 -Connecting with the physical spaces as the technologies of Materials, Devices, Processes, Circuits, and Applications-

2:30 PM - 2:45 PM JST(5:30 AM - 5:45 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16p-A36-3] Refined Measurement of the Specific Contact Resistivity of Interface between Thermoelectric Semiconductors and Metal with Advanced Transfer Length Method

〇(M1)Akihiro Katsura¹, Maki Tsurumoto¹, Yukiko Hirose¹, Daniele Micucci², Takashi Sato^3,4, Eiji Iwase⁴, Tohru Sugahara^1,4 (1.Kyoto Inst., 2.PoliTo, 3.AIST, 4.Waseda Univ.)

Keywords:

Interface between Semiconductor and Metal,Contact Resistance,Transfer Length Method