Presentation Information

[17p-C43-10]Evaluation of ScAlN Thin Films by Line-Focus-Beam Ultrasonic-Material-Characterization System

〇Yuji Ohashi1, Jun-ichi Kushibiki1, Kentaro Totsu1, Ayaka Hanai2, Ayaka Katsumata2, Takahiko Yanagitani2, Hiroaki Takeno3, Takahiro Ito3 (1.Tohoku Univ., 2.Waseda Univ., 3.GEOMATEC Co. Ltd)

Keywords:

piezoelectric thin film,leaky surface acoutice wave velocity


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