Presentation Information
[18a-A32-4]Assessment of charge noise correlation between neighboring silicon qubits based on the current through a double quantum dot
〇Ryutaro Matsuoka1, Tatsuya Matsuda1, Kazuto Takahashi1, Ryuta Tsuchiya2, Toshiyuki Mine2, Digh Hisamoto2, Hiroyuki Mizuno2, Raisei Mizokuchi1, Tetsuo Kodera1, Jun Yoneda1 (1.Tokyo Tech, 2.R&D Group, Hitachi Ltd.)
Keywords:
silicon quantum bit,charge noise,cross-correlation
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