Presentation Information

[18p-P01-14]Trials on real-time measurement of diagnostic X-rays using small Si semiconductor devices.

〇(D)Takumi Matsumoto1, Yohei Inaba2, Shinnosuke Matsumoto3, Wataru Kada1 (1.QSE, Tohoku Univ., 2.Tohoku Univ., 3.Tokyo Metro Univ.)
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Keywords:

semiconductor detector,real-time measurement

Interventional radiology (IR) techniques, which are non-invasive treatments by means of radiological imaging, have been in demand year after year. On the other hand, dosimetry and protection methods for procedures involving intermittently delivered radiation continue to be challenging for both the healthcare professionals involved and the patients being treated. In some medical practices, radiation-induced tissue damage has been reported in some patients following IVR procedures. Real-time radiation monitoring of the medical radiation delivered to patients during procedures is needed to prevent such tissue damage, improve quality assurance/quality control (QA/QC) of therapeutic diagnosis, and identify problem areas in real time. To address these issues, a dosimetry system was constructed using a spherical radiation sensor element with omnidirectional detection. An X-ray diagnostic imaging system was utilized for the evaluation. The reading current was measured approximately in accordance with the length of the output pulse (1000 msec) of the diagnostic imaging system. By evaluating the angle dependence and energy dependence, it will be possible to evaluate the usefulness of this dosimeter for measuring patient doses during various diagnostic imaging procedures in the future.

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