[19a-D62-1~9] 22.1 Joint Session M "Phonon Engineering"

11:00 AM - 11:15 AM JST(2:00 AM - 2:15 AM UTC)

[19a-D62-8] Development of the High-Throughput time-domain thermoreflectance technique

〇Hiroto Arima¹, Yuichiro Yamashita¹, Takashi Yagi¹ (1.AIST)

Keywords:

Thermophysical properties,thin film,TDTR

The conventional time-domain thermoreflectance method (TDTR method) measures thermorefrectance respons by controling the arravial time between the pump and probe pulses. However, the conventiona TDTR method requires a long measurement time of about 10 minuit per measurement. In this present, we discussed the high-throughput TDTR method by simultaneous measurement using probe pulses with different delays for different wavelangths.