[19p-A37-1~15] 3.7 Optical measurement, instrumentation, and sensor

5:15 PM - 5:30 PM JST(8:15 AM - 8:30 AM UTC)

[19p-A37-14] ASE Noise Measurement of Semiconductor Optical Amplifier Using Single Photon Avalanche Diode

〇Yasutoshi Inoguchi¹, Kaito Nagasawa¹, Kazuyoku Tei¹ (1.tokai univ.)

Keywords:

semiconductor,ASE,Single Photon Avalanche Diode

A laser with a wavelength in the 900 nm band is used in optical sensing technologies such as LiDAR (Light Detection and Ranging) and ToF (Time of Flight) systems. The pulse light output of a 900 nm band semiconductor laser (LD) can be increased using a Semiconductor Optical Amplifier (SOA). However, SOAs generate Amplified Spontaneous Emission (ASE), which reduces pulse contrast and poses a challenge. Our research lab has been working on improving pulse contrast [1]. Accurate measurement of ASE, which is weak light, is crucial for precise pulse contrast measurement. In this study, we apply photon counting using SPAD for ASE measurement.