Presentation Information

[19p-B5-1]Observation of crack generation in Ge-on-Si(111) and its suppression

〇Yuuka Shibahara1, Shuya Kikuoka1, Masaki Nagao1, Ryota Mizoguchi1, Michihiro Yamada1, Kohei Hamaya2,3, Kentarou Sawano1 (1.Tokyo City Univ., 2.CSRN, Osaka Univ., 3.OTRI, Osaka Univ)

Keywords:

Ge-on-Si,crack


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