[19p-D61-1~18] 2.1 Detection Devices

1:45 PM - 2:00 PM JST(4:45 AM - 5:00 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[19p-D61-4] Development of Ce-doped (Gd, Tb)₃Al₂Ga₃O₁₂ Single-Crystal Scintillator for High-Resolution X-ray Imaging

〇(M2)Kazuya Omuro^1,2, Masao Yoshino^2,3, Liudmila Gushchina⁴, Seiichi Yamamoto⁶, Kouhei Nakanishi⁷, Kei Kamada^2,3,4, Kyoung Jin Kim², Takahiko Horiai^2,3, Rikito Murakami², Akihiro Yamaji^2,3, Takashi Hanada², Yuui Yokota², Shunsuke Kurosawa^2,3,5, Yuji Ohashi^2,3, Hiroki Sato^2,3, Akira Yoshikawa^2,3,4 (1.Grad. Sch. Eng., Tohoku Univ., 2.IMR, Tohoku Univ., 3.NICHe, Tohoku Univ., 4.C&A Corp., 5.Osaka Univ., 6.Waseda Univ., 7.Nagoya Univ.)

Keywords:

X-ray imaging,scintillator,ternary garnet oxide

In this study, Cz-method was used for the growth of 1-inch GAGG:Ce,Tb single crystal for X-ray imaging. The X-ray imaging detector was constructed using the grown crystal, and its spatial resolution and sensitivity were compared with those of GAGG:Ce and commercially available LuAG:Ce scintillator. As a result, the sensitivity was improved by 2.4 times compared to LuAG:Ce scintillator, and a spatial resolution of 0.85 μm was achieved.