Presentation Information

[20p-A31-2]Assessing point defects in CVD-grown monolayer WSe2 using conductive AFM

〇(M1)Yuta Sawai1, Takahiko Endo1, Yasumitsu Miyata1 (1.Tokyo Metro. Univ.)

Keywords:

Transition metal dichalcogenide,Conductive AFM


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