[18p-A36-1~11]Application of Advanced Ion/Electron Microscopy for Future Nanoscale Materials and Devices
Wed. Sep 18, 2024 1:30 PM - 6:15 PM JST
Wed. Sep 18, 2024 4:30 AM - 9:15 AM UTC
Wed. Sep 18, 2024 4:30 AM - 9:15 AM UTC
A36 (TOKI MESSE 3F)
Shinichi Ogawa(AIST), Yuji Otsuka(Toray Research Center, Inc.)