[23p-12F-1~14] 6.6 Probe Microscopy

2:45 PM - 3:00 PM JST(5:45 AM - 6:00 AM UTC)

[23p-12F-6] Dc magnetic field detection method by alternating magnetic force microscopy and its application to quantitative magnetic field imaging

Ren Ehara¹, Hiroshi Sonobe¹, Toru Matsumura¹, 〇Hitoshi Saito¹ (1.Akita Univ.)

Keywords:

magnetic force microscopy