Presentation Information

[23p-12G-4]Non-contact atomic force microscopy investigation of line defect on rutile TiO2(110)-(1×2) reconstructed surface

〇daiki katsube1, Tatsuya Yokoi2, Eiichi Inami3, Fengxuan Li4, Katsuyuki Matsunaga2, Masayuki Abe4 (1.RIKEN, 2.Nagoya Univ., 3.Kochi Univ. Tech., 4.OsakaUniv.)

Keywords:

photocatalyst,NC-AFM,STM