[23p-P01-1~39] 2 Ionizing Radiation (Poster)

[23p-P01-8] Evaluation of TlBr Thin Film Formed by Vacuum Evaporation

〇(D)Kohei Toyoda^1,2, Shoma Hayakawa³, Junichi Nishizawa^1,4, Katsuyuki Takagi^2,4, Hiroki Kase⁴, Toru Aoki^2,4 (1.Shizuoka Univ. CMMP, 2.ANSeeN Inc., 3.Shizuoka Univ. Inf., 4.Shizuoka Univ. RIE)

Keywords:

Thallium Bromide,Semiconductor detector,Thin Film