[24p-31A-1~14] FS.1 Focused Session "AI Electronics"

4:45 PM - 5:00 PM JST(7:45 AM - 8:00 AM UTC)English Presentation

[24p-31A-14] Analysis of Read Current Fluctuation in Low Resistance State ReRAM by using Fluctuation Pattern Classifier

〇(M2)Zhiyuan Huang¹, Ayumu Yamada¹, Naoko Misawa¹, Chihiro Matsui¹, Ken Takeuchi¹ (1.Univ. Tokyo)

Keywords:

Computation-in-Memory,Neural network,ReRAM

ReRAM is a type of non-volatile memory which is suitable for Computation-in-Memory (CiM)because of its high speed, scalability, and power efficiency. The fluctuation in the ReRAM's readcurrent influences the performance of ReRAM and ReRAM-based CiM. In this work, aconvolutional neural network-based fluctuation pattern classifier trained by synthesized databaseis used to detect different types of low resistance state ReRAM read current. Fluctuation dataunder different measurement conditions is analyzed.