[24p-P04-1~7] 6.6 Probe Microscopy

[24p-P04-6] Measurement of band bending on TiO₂(110) surface by High-Low frequency KPFM

〇(M1)Sota Odani¹, Sugawara Yasuhiro¹, Li Yanjun¹ (1.Osaka Univ.)

Keywords:

TiO2,AFM