Presentation Information

10:00 AM - 10:15 AM JST(1:00 AM - 1:15 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[10a-N405-3]Demonstration of Tlerance to Parameter Variations in Superconducting ReLU Neuron Circuit

〇Yuto Ueno¹, Yuki Hironaka², Nobuyuki Yoshikawa^1,2, Yuki Yamanashi^1,2 (1.Yokohama National Univ., 2.Yokohama National Univ. IAS)

Keywords:

SFQ circuit,Neuromorphic Computing,ReLU

Attempts have been made to improve power consumption and processing speed compared to conventional software-based implementations by creating circuits specifically for artificial neural networks. However, neuron circuits designed in previous research are not suitable for large-scale networks due to variations in output characteristics caused by manufacturing errors in the circuits. This research demonstrated a circuit that is resilient to parameter fluctuations due to manufacturing errors by measuring it across multiple chips.

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