Presentation Information
[10a-N405-4]Evaluation of Error-Rate Test Circuits for Measuring Radiation Tolerance in Single
Flux Quantum Circuits
〇Kazuto Osakabe1, Yuki Yamanashi1, Nobuyuki Yoshikawa1 (1.Yokohama Natl. Univ.)
Keywords:
Superconductor,SFQ circuit
With the rapid development of information technology in recent years, single flux quantum circuits (SFQ circuits) have been proposed as an alternative circuit scheme to semiconductor integrated circuits, which can operate with low power consumption and high speed. Recently, it has been pointed out that secondary cosmic ray particles such as γ-rays can be a potential source of interference to large-scale superconducting circuits. In this study, we evaluated an error rate test circuit with the aim of measuring the frequency of malfunctions caused by environmental radiation in SFQ circuits.