Presentation Information
[10p-N107-5]Demonstration of X-ray polarimetric imaging and spectroscopy using a curved silicon Bragg crystal formed by hot plastic deformation
〇Daiki Ishi1, Aoi Ishimure2, Yuichiro Ezoe2, Kumi Ishikawa2, Masaki Numazawa2, Hiromi Morishita2, Daiki Morimoto2, Shunei Miyauchi2, Yuto Ogasawara2, Naoya Sera2, Yu Fukushima2, Kazuhisa Mitsuda3, Kohei Morishita4, Kazuo Nakajima5 (1.ISAS/JAXA, 2.Tokyo Metropolitan Univ., 3.NAOJ, 4.Kyushu Univ., 5.Tohoku Univ.)
Keywords:
hot plastic deformation,curved silicon crystal,X-ray polarimetric spectrometer
We are developing a novel Bragg reflection X-ray polarimetric spectrometer based on a curved silicon crystal formed by hot plastic deformation. This technique enables continus variation of Bragg angles across the wafer, resulting in a wide energy band and X-ray focusing capability. By offsetting the detector from the focal plane, our polarimeter simultaneously achieves high-resolution spectroscopy. Using the ISAS/JAXA 30 m beamline, we irradiated a sample polarimeter fabricated from a 4-inch silicon (100) wafer with Fe Kα lines, and successfully demonstrated Bragg-reflected X-ray imaging, focusing, and spectroscopy with this method for the first time.