Presentation Information
[10p-N203-4]Magneto-Optical Terahertz Time-Domain Ellipsometry of the Narrow-Gap Semiconductor InSb with Varying Carrier Densities
〇(D)Zixi Zhao1, Verdad C. Agulto1, Atsuki Kamio1, Kosaku Kato1, Thanh Nhat Khoa Phan1, Toshiyuki Iwamoto1,2, Toshihiko Shimizu1, Nobuhiko Sarukura1, Makoto Nakajima1 (1.ILE, Univ. of Osaka, 2.PNP)
Keywords:
semiconductor evaluation
In order to demonstrate the application of magneto-optical terahertz time-domain ellipsometry (MO-THz-TDE) in the characterization of semiconductors, doped and undoped InSb wafers were evaluated with a magnetic field of B = 0.4 T. The dielectric tensors of both InSb samples were obtained, and the magneto plasmon–phonon coupling effect was observed. Furthermore, electron transport properties such as effective mass and carrier density were derived using the Drude model without any assumptions.