[10p-S101-1~6] Future of informatics applications - Global trends, interdisciplinary collaboration, and new challenges -

2:45 PM - 3:15 PM JST(5:45 AM - 6:15 AM UTC)

[10p-S101-4] Progress and Outlook of Metrology Informatics

〇Shigetaka Tomiya¹ (1.NAIST)

Keywords:

Metrology informatics

Metrology informatics has evolved into a core technology for materials and device R&D by enabling the analysis of increasingly complex and large-scale measurement data, as well as the integration of diverse characterization techniques. This talk will present its recent advances and future prospects.