Presentation Information

11:15 AM - 11:30 AM JST(2:15 AM - 2:30 AM UTC)

[7a-N106-9]Mie Void Sensing of Refractive Index Change in a Liquid under High Pressure

〇HIROMASA NIINOMI¹, HIROKI NADA², YUMIKO KODAMA³, TETSUYA HAMA⁴, TOMOYA OSHIKIRI^1,5, MASARU NAKAGAWA¹, YUKI KIMURA⁶ (1.IMRAM, Tohoku Univ., 2.Grad. Sch. Eng., Tottori Univ., 3.IMR, Tohoku Univ., 4.KIS, The Univ. Tokyo, 5.RIES, Hokkaido Univ., 6.ILTS, Hokkaido Univ.)

Keywords:

Mie-void resonance,high-pressure anvil cell,silicon carbide

Recently, Mie-void resonance, which excites in void nanostructures fabiricated on surfaces of high-refractive-index materials, attracts increasing attentions from the viewpoint of applied nanophotonics. Here we demonstrate a new technique for the sensing of changes in refractive index of materials under high pressure based on spectrum shift of Mie voids fabricated on a SiC anvil of an anvil cell.

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