Presentation Information
[8p-N405-15]Soft X-ray Reflectivity Studies Using a Laser-based High-Harmonic Light Source
〇HungWei Sun1, Ryunosuke Takahashi2, Nobuhisa Ishii1, Momoko Maruyama1, Kohei Yoshimatsu3, Hiroki Wadachi2, Ryuji Itakura1 (1.QST KPSI, 2.Univ. of Hyogo, 3.Science Tokyo)
Keywords:
high harmonic generation,soft X-ray spectroscopy
We present reflection measurements performed with a compact soft X-ray light source based on high-order harmonic generation, driven by an intense optical parametric chirped pulse amplifier operating at a central wavelength of 2000 nm and a repetition rate of 5 kHz