Presentation Information
[9a-P02-4]Valence state and electronic structure of c-axis oriented ZnO:Eu thin film by soft-X-ray spectroscopy
〇Eiki Masutomi1, Yicheng Wang1, Ryota Morizane1, Dasisuke Shiga2, Hiroshi Kumigashira2, Tohru Higuchi1 (1.Tokyo Univ.Sci., 2.Tohoku Univ)
Keywords:
ZnO:Eu thin film,Eu valence state,Soft-X-ray spectroscopy
In this study, we have prepared the c-axis oriented ZnO:Eu thin film on Al2O3 substrate by RF magnetron sputtering using ceramic target. Furthermore, we characterized the Eu valence state by X-ray absorption spectroscopy and the Eu 4f-related electronic structure in the valence band region by resonant photoemission spectroscopy.