Presentation Information
[10a-C310-13]Epitaxy and physical properties of the mixed-anion compound ZrNxHy
〇(DC)Daichi Miyazaki1, Kohei Yoshimatsu1, Akira Ohtomo1 (1.Science Tokyo)
Keywords:
mixed-anion compound,nitride hydride,epitaxial thin film
We have recently established a technique for fabricating thin films of the mixed-anion compound ZrNxHy on c-plane α-Al2O3 substrates. However, fabricating in-plane oriented films remained a challenge. In this study, we investigated the in-plane orientation temperatures of ZrN and ZrH2, and achieved the epitaxial growth of ZrNxHy at 600°C on (111) MgO substrates. Furthermore, the residual resistivity of the thin film decreased with in-plane orientation. In this presentation, we will also discuss the electronic effects of mixed- anionization.
