[10p-E308-1~18] 6.6 Probe Microscopy

5:00 PM - 5:15 PM JST(8:00 AM - 8:15 AM UTC)

[10p-E308-14] Sub-nm structural analysis of amorphous oxide surfaces investigated by 3D-AFM

〇Yuki Tanimoto¹, Moe Ogasawara¹, Nozomu Matuoka², Tomohisa Yoshioka², Yuichi Fujioka³, Hiroki Kageyama³, Yusuke Narusaka³, Hitoshi Asakawa¹ (1.Kanazawa Univ., 2.Kobe Univ., 3.Daicel)

Keywords:

Three dimensional scanning atomic force microscopy,Amorphous oxide