Session Details
[10p-E308-1~18]6.6 Probe Microscopy
Thu. Sep 10, 2026 1:30 PM - 6:15 PM JST
Thu. Sep 10, 2026 4:30 AM - 9:15 AM UTC
Thu. Sep 10, 2026 4:30 AM - 9:15 AM UTC
E308 (First Year Education Bld. E Block)
[10p-E308-1]Estimation of SiO2/SiC interface-state emission time constant spectrum using variable-temperature time-resolved SNDM
〇Kohei Yamasue1, Yasuo Cho2 (1.RIEC, Tohoku Univ., 2.NICHe, Tohoku Univ.)
[10p-E308-2]Real-Space Observation of Local Metal-Insulator Transition Dynamics in VO2 Using Infrared Scanning Near-Field Optical Microscopy
〇Ryosuke Iwakiri1, Jun Nishida2, Masahiro Ohara1, Takashi Kumagai2, Masayuki Abe1 (1.Osaka Univ., 2.IMS)
[10p-E308-3]Thickness Dependence of Infrared and Contact Resonance Responses in AFM-IR
〇Yuya Yamada1, Yuichi Kato1, Yusuke Yagi1, Takuya Mitsuoka1, Katsutoshi Abiko1 (1.Toyota Central R&D Labs., Inc.)
[10p-E308-4]Development of tip-oscillation synchronized detection of infrared spectroscopy (TS-IR)
〇Yuta Okabe1, Ryuji Hosokawa1, Yuki Araki1, Masahiko Tomitori2, Toyoko Arai1 (1.Kanazawa Univ., 2.JAIST)
[10p-E308-5]Time-resolved Electrostatic Force Microscopy under Base Bias Control
〇Kyo Ogino1, Kaita Takemoto1, Jo Sato1, Ryota Ishibashi1, Takuji Takahashi1 (1.IIS, Univ. Tokyo)
[10p-E308-6]Precision Improvement in Time-Resolved Scanning Tunneling Spectroscopy
〇Keisuke Kuboki1, Yuki Deguchi1, Osamu Takeuchi1, Yusuke Arasida1, Hiroyuki Mogi1, Shoji Yoshida1, Hidemi Sigekawa1 (1.Univ. of Tsukuba.)
[10p-E308-7]Analysis of Field-Evaporation-Exposed TiO2 Surfaces by Atomic-Resolution STM Observation and 3D Compositional Analysis Using Atom Probe Tomography
〇(M2)Shun Harada1, Shu Kurokawa1, Koji Inoue2 (1.Kyoto Univ., 2.Tohoku Univ. IMR)
[10p-E308-8]Automated STM Measurement with Minimal Training Data: SVM-Based Molecule Recognition and Fully Automated I-V Spectroscopy
〇(M2)Yuto Onishi1, Zhuo Diao1, Takashi Kumagai2, Masahiro Ohara1, Masayuki Abe1 (1.Osaka Univ., 2.Molecular Inst.)
[10p-E308-9]Characterization of Single Donor Charge State Transition in n-type InAs by Scanning Tunneling Spectroscopy
〇Kiyoshi Kanisawa1 (1.NTT-BRL)
[10p-E308-10]Critical-Tunneling Stabilization of Single Fe Atoms on MgO/Fe(001)
〇Toyokazu Yamada1, Kohei Tada2 (1.Chiba Univ., 2.Osaka Univ.)
[10p-E308-11]Magnetic force excitation mechanism for atomic force microscopy cantilever switchable between flexural and torsional oscillation modes
Kouichirou Furuki1, 〇Masami Kageshima1 (1.Osaka Electro-Communication Univ.)
[10p-E308-12]Analysis of Molten Salt/Solid interfaces by High-Temperature qPlus AFM
〇Shogo Kamio1, Yuto Nishiwaki1, Takashi Ichii1 (1.Kyoto Univ.)
[10p-E308-13]AFM analysis of corrosion protection film for semiconductor’s fine wires on Cu2O in-liquid environment
〇Kaito Hayashi1, Daiki Oka1, Tomoki Yokawa1, Kazuki Miyata1, Megumi Uno2, Chikako Takatoh2, Takeshi Fukuma1 (1.Kanazawa Univ., 2.EBARA Corp.)
[10p-E308-14]Sub-nm structural analysis of amorphous oxide surfaces investigated by 3D-AFM
〇Yuki Tanimoto1, Moe Ogasawara1, Nozomu Matuoka2, Tomohisa Yoshioka2, Yuichi Fujioka3, Hiroki Kageyama3, Yusuke Narusaka3, Hitoshi Asakawa1 (1.Kanazawa Univ., 2.Kobe Univ., 3.Daicel)
[10p-E308-15]Measurement of charge transfer from interface levels to bulk levels using pump-probe heterodyne FM-KPFM
〇Yuto Mukai1, Yasuhiro Sugawara1, Yanjun Li1 (1.UOsaka)
[10p-E308-16]Distribution of the topmost molecules and their hydrogen bonds at an organic crystal/water interface visualized by three-dimensional scanning AFM
〇Yuta Ishii1, Keita Watanabe2, Yasuhide Inokuma2, Masayuki Morimoto1, Hitoshi Asakawa1 (1.Kanazawa Univ., 2.Hokkaido Univ.)
[10p-E308-17]Simultaneous measurement of topography and charge distribution using scanning ion conductance microscopy with a concentrated gradient double-barrel pipette
〇Kenta Kobayashi1, Osamu Hoshi2, Kenta Nakazawa1, Futoshi Iwata1,3 (1.Shizuoka Univ., 2.Institute of Science Tokyo, 3.RIE Shizuoka Univ.)
[10p-E308-18]Analysis of impedance distributions inside all-solid-state batteries using heterodyne scanning impedance microscopy
〇Yuji Yamagishi1, Hirotada Gamo1, Zyun Siroma1, Yusuke Morino1, Naoya Ishida1, Yasushi Maeda1, Tetsu Kiyobayashi1, Nobuhiko Takeichi1, Kentaro Kuratani1, Hikaru Sano1 (1.AIST)
