[10p-E308-1~18] 6.6 Probe Microscopy

5:45 PM - 6:00 PM JST(8:45 AM - 9:00 AM UTC)

[10p-E308-17] Simultaneous measurement of topography and charge distribution using scanning ion conductance microscopy with a concentrated gradient double-barrel pipette

〇Kenta Kobayashi¹, Osamu Hoshi², Kenta Nakazawa¹, Futoshi Iwata^1,3 (1.Shizuoka Univ., 2.Institute of Science Tokyo, 3.RIE Shizuoka Univ.)

Keywords:

scanning ion conductance microscopy